Componente electronice : SN54BCT8374AFK

Producator : Texas Instruments

Ambalaje :

Pin :

Descriere : SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Temperatura : Min °C | Max °C

Datasheet : SN54BCT8374AFK PDF

• SN54BCT8373A
• SN54BCT8373AFK
• SN54BCT8373AJT
• SN54BCT8374A
• SN54BCT8374AFK
• SN54BCT8374AJT
• SN54BCT8374A_08